In a paper presented at the International Solid-State Circuits Conference here Tuesday, Intel said that it has used a “write-verify-write” scheme and a two-stage current sensing technique to create 7-Mb perpendicular STT-MRAM arrays in its 22FFL FinFET process. The company had provided early details of its success in developing the first FinFET-based MRAM devices last year at the International Electron Devices Meeting.More details at EE Times.
Intel gets FinFET-based embedded MRAM ready for production
Posted on Thursday, February 21 2019 @ 14:19 CET by Thomas De Maesschalck