Along with high-speed control, a read retry function has been added which is essential for ensuring data reliability when using the latest MLC type NAND flash memory. Together with the auto-recovery, data randomizer, and auto-refresh functions of the existing GBDriver series, this design accommodates also future developments in the flash memory format. Data reliability is significantly enhanced by the highly acclaimed GBDriver power interruption tolerance algorithm. For customers requiring an even higher level of data reliability, the Enhanced ECC function makes it possible to expand ECC to 71 bits per 512 byte block.Full details at X-bit Labs
The sophisticated static wear leveling algorithm averages the write and erase process over all blocks of the memory area, thereby drastically improving the lifespan of installed flash memory. SMART (self-monitoring & analysis reporting technology) provides information about the number of times that memory blocks have been erased (programmed), which facilitates quantitative lifespan management of flash storage.
TDK shows SSD controller for embedded SSDs with 10nm class NAND
Posted on Wednesday, Nov 07 2012 @ 20:09 CET by Thomas De Maesschalck